BibTeX record conf/cicc/MakrisOV00

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@inproceedings{DBLP:conf/cicc/MakrisOV00,
  author       = {Yiorgos Makris and
                  Alex Orailoglu and
                  Praveen Vishakantaiah},
  title        = {Modular test generation and concurrent transparency-based test translation
                  using gate-level {ATPG}},
  booktitle    = {Proceedings of the {IEEE} 2000 Custom Integrated Circuits Conference,
                  {CICC} 2000, Orlando, FL, USA, May 21-24, 2000},
  pages        = {75--78},
  publisher    = {{IEEE}},
  year         = {2000},
  url          = {https://doi.org/10.1109/CICC.2000.852621},
  doi          = {10.1109/CICC.2000.852621},
  timestamp    = {Mon, 10 Oct 2022 09:13:21 +0200},
  biburl       = {https://dblp.org/rec/conf/cicc/MakrisOV00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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