BibTeX record conf/cicc/HazuchaKWBTMSDN03

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@inproceedings{DBLP:conf/cicc/HazuchaKWBTMSDN03,
  author       = {Peter Hazucha and
                  Tanay Kamik and
                  Steven Walstra and
                  Bradley A. Bloechel and
                  James W. Tschanz and
                  Jose Maiz and
                  Krishnamurthy Soumyanath and
                  Greg Dermer and
                  Siva G. Narendra and
                  Vivek De and
                  Shekhar Borkar},
  title        = {Measurements and analysis of {SER} tolerant latch in a 90 nm dual-Vt
                  {CMOS} process},
  booktitle    = {Proceedings of the {IEEE} Custom Integrated Circuits Conference, {CICC}
                  2003, San Jose, CA, USA, September 21 - 24, 2003},
  pages        = {617--620},
  publisher    = {{IEEE}},
  year         = {2003},
  url          = {https://doi.org/10.1109/CICC.2003.1249472},
  doi          = {10.1109/CICC.2003.1249472},
  timestamp    = {Mon, 28 Feb 2022 17:00:23 +0100},
  biburl       = {https://dblp.org/rec/conf/cicc/HazuchaKWBTMSDN03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}