BibTeX record conf/cicc/BradleyJSZ99

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@inproceedings{DBLP:conf/cicc/BradleyJSZ99,
  author       = {Arthur T. Bradley and
                  Richard C. Jaeger and
                  Jeffrey C. Suhling and
                  Y. Zou},
  title        = {Test chips for die stress characterization using arrays of {CMOS}
                  sensors},
  booktitle    = {Proceedings of the {IEEE} 1999 Custom Integrated Circuits Conference,
                  {CICC} 1999, San Diego, CA, USA, May 16-19, 1999},
  pages        = {147--150},
  publisher    = {{IEEE}},
  year         = {1999},
  url          = {https://doi.org/10.1109/CICC.1999.777262},
  doi          = {10.1109/CICC.1999.777262},
  timestamp    = {Fri, 07 Jul 2023 11:00:51 +0200},
  biburl       = {https://dblp.org/rec/conf/cicc/BradleyJSZ99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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