Asen Asenov Binjie Cheng Daryoosh Dideban Urban Kovac Negin Moezi Campbell Millar Gareth Roy Andrew R. Brown Scott Roy Modeling and simulation of transistor and circuit variability and reliability. 1-8 2010 CICC http://dx.doi.org/10.1109/CICC.2010.5617627 conf/cicc/2010 db/conf/cicc/cicc2010.html#AsenovCDKMMRBR10