Ying Xu Eduard Cerny Allan Silburt A. Coady Ying Liu Philip Pownall Practical Application of Formal Verification Techniques on a Frame Mux/Demux Chip from Nortel Semiconductors. 110-124 http://link.springer.de/link/service/series/0558/bibs/1703/17030110.htm 1999 conf/charme/1999 CHARME db/conf/charme/charme1999.html#XuCSCLP99