BibTeX record conf/cec/OtakaFKMSIM20

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@inproceedings{DBLP:conf/cec/OtakaFKMSIM20,
  author       = {Naoya Otaka and
                  Yoshikazu Fukuyama and
                  Yu Kawamura and
                  Kenya Murakami and
                  Adamo Santana and
                  Tatsuya Iizaka and
                  Tetsuro Matsui},
  title        = {Refrigerated Showcase Fault Detection by a Pasting based Artificial
                  Neural Networks using Parallel Multi-population Modified Brain Storm
                  optimization and Correntropy},
  booktitle    = {{IEEE} Congress on Evolutionary Computation, {CEC} 2020, Glasgow,
                  United Kingdom, July 19-24, 2020},
  pages        = {1--8},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/CEC48606.2020.9185511},
  doi          = {10.1109/CEC48606.2020.9185511},
  timestamp    = {Fri, 11 Sep 2020 15:04:36 +0200},
  biburl       = {https://dblp.org/rec/conf/cec/OtakaFKMSIM20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}