BibTeX record conf/ccece/RenRGH19

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@inproceedings{DBLP:conf/ccece/RenRGH19,
  author       = {Jing Ren and
                  Rui Ren and
                  Mark Green and
                  Xishi Huang},
  title        = {Defect Detection from X-Ray Images Using {A} Three-Stage Deep Learning
                  Algorithm},
  booktitle    = {2019 {IEEE} Canadian Conference of Electrical and Computer Engineering,
                  {CCECE} 2019, Edmonton, AB, Canada, May 5-8, 2019},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/CCECE.2019.8861944},
  doi          = {10.1109/CCECE.2019.8861944},
  timestamp    = {Tue, 05 Sep 2023 13:50:41 +0200},
  biburl       = {https://dblp.org/rec/conf/ccece/RenRGH19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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