BibTeX record conf/ccece/AebtarmB09

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@inproceedings{DBLP:conf/ccece/AebtarmB09,
  author       = {Surath Aebtarm and
                  Nizar Bouguila},
  title        = {An optimal bivariate Poisson field chart for monitoring defects},
  booktitle    = {Proceedings of the 22nd Canadian Conference on Electrical and Computer
                  Engineering, {CCECE} 2009, 3-6 May 2009, Delta St. John's Hotel and
                  Conference Centre, St. John's, Newfoundland, Canada},
  pages        = {691--694},
  publisher    = {{IEEE}},
  year         = {2009},
  url          = {https://doi.org/10.1109/CCECE.2009.5090218},
  doi          = {10.1109/CCECE.2009.5090218},
  timestamp    = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl       = {https://dblp.org/rec/conf/ccece/AebtarmB09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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