BibTeX
@inproceedings{DBLP:conf/cata/Kim02,
author = {Wu Woan Kim},
title = {Exhaustive Test Pattern Generation for Parallel Testing},
booktitle = {Computers and Their Applications},
year = {2002},
pages = {160-163},
crossref = {DBLP:conf/cata/2002},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/cata/2002,
editor = {Rex E. Gantenbein and
Sung Y. Shin},
title = {Proceedings of the ISCA 17th International Conference Computers
and Their Applications, April 4-6, 2002, Canterbury Hotel,
San Francisco, California, USA},
booktitle = {Computers and Their Applications},
publisher = {ISCA},
year = {2002},
isbn = {1-880843-42-0},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2007-01-10 by Michael Ley (ley@uni-trier.de)