BibTeX record conf/case/SchieleJBKPSH21

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@inproceedings{DBLP:conf/case/SchieleJBKPSH21,
  author       = {Tobias Schiele and
                  Andreas Jansche and
                  Timo Bernthaler and
                  Anton Kaiser and
                  Daniel Pfister and
                  Stefan Sp{\"{a}}th{-}Stockmeier and
                  Christian Hollerith},
  title        = {Comparison of deep learning-based image segmentation methods for the
                  detection of voids in X-ray images of microelectronic components},
  booktitle    = {17th {IEEE} International Conference on Automation Science and Engineering,
                  {CASE} 2021, Lyon, France, August 23-27, 2021},
  pages        = {1320--1325},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/CASE49439.2021.9551671},
  doi          = {10.1109/CASE49439.2021.9551671},
  timestamp    = {Fri, 08 Oct 2021 19:47:37 +0200},
  biburl       = {https://dblp.org/rec/conf/case/SchieleJBKPSH21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}