BibTeX record conf/case/RabhiRPA21

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@inproceedings{DBLP:conf/case/RabhiRPA21,
  author       = {Ilham Rabhi and
                  Agn{\`{e}}s Roussy and
                  Fran{\c{c}}ois Pasqualini and
                  Cyril Alegret},
  title        = {Out-Of-Control Detection In Semiconductor Manufacturing using One-Class
                  Support Vector Machines},
  booktitle    = {17th {IEEE} International Conference on Automation Science and Engineering,
                  {CASE} 2021, Lyon, France, August 23-27, 2021},
  pages        = {1628--1633},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/CASE49439.2021.9551477},
  doi          = {10.1109/CASE49439.2021.9551477},
  timestamp    = {Fri, 08 Oct 2021 19:47:39 +0200},
  biburl       = {https://dblp.org/rec/conf/case/RabhiRPA21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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