BibTeX record conf/case/AllenT10

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@inproceedings{DBLP:conf/case/AllenT10,
  author       = {Lindsay V. Allen and
                  Dawn M. Tilbury},
  title        = {Event-based fault detection of manufacturing cell: Data inconsistencies
                  between academic assumptions and industry practice},
  booktitle    = {{IEEE} Conference on Automation Science and Engineering, {CASE} 2010,
                  Toronto, ON, Canada, 21-24 August, 2010},
  pages        = {426--432},
  publisher    = {{IEEE}},
  year         = {2010},
  url          = {https://doi.org/10.1109/COASE.2010.5584595},
  doi          = {10.1109/COASE.2010.5584595},
  timestamp    = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl       = {https://dblp.org/rec/conf/case/AllenT10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}