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BibTeX record conf/caip/DijkGAVV03
@inproceedings{DBLP:conf/caip/DijkGAVV03, author = {Judith Dijk and Michael van Ginkel and Rutger J. van Asselt and Lucas J. van Vliet and Piet W. Verbeek}, editor = {Nicolai Petkov and Michel A. Westenberg}, title = {A New Sharpness Measure Based on Gaussian Lines and Edges}, booktitle = {Computer Analysis of Images and Patterns, 10th International Conference, {CAIP} 2003, Groningen, The Netherlands, August 25-27, 2003, Proceedings}, series = {Lecture Notes in Computer Science}, volume = {2756}, pages = {149--156}, publisher = {Springer}, year = {2003}, url = {https://doi.org/10.1007/978-3-540-45179-2\_19}, doi = {10.1007/978-3-540-45179-2\_19}, timestamp = {Tue, 14 May 2019 10:00:53 +0200}, biburl = {https://dblp.org/rec/conf/caip/DijkGAVV03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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