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DBLP Record 'conf/caine/Farhat01'

BibTeX

@inproceedings{DBLP:conf/caine/Farhat01,
  author    = {Hassan Farhat},
  title     = {Test Generation for VLSI Circuits from Testability Profile
               Distribution},
  booktitle = {CAINE},
  year      = {2001},
  pages     = {201-204},
  crossref  = {DBLP:conf/caine/2001},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/caine/2001,
  editor    = {Anthony Chung},
  title     = {Proceedings of the 14th International Conference on Computer
               Applications in Industry and Engineering, November 27-29,
               2001, Las Vegas, Nevada, USA},
  booktitle = {CAINE},
  publisher = {ISCA},
  year      = {2001},
  isbn      = {1-880843-40-4},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

Copyright © 2007-01-18 by Michael Ley (ley@uni-trier.de)