BibTeX
@inproceedings{DBLP:conf/caine/Farhat01,
author = {Hassan Farhat},
title = {Test Generation for VLSI Circuits from Testability Profile
Distribution},
booktitle = {CAINE},
year = {2001},
pages = {201-204},
crossref = {DBLP:conf/caine/2001},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/caine/2001,
editor = {Anthony Chung},
title = {Proceedings of the 14th International Conference on Computer
Applications in Industry and Engineering, November 27-29,
2001, Las Vegas, Nevada, USA},
booktitle = {CAINE},
publisher = {ISCA},
year = {2001},
isbn = {1-880843-40-4},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2007-01-18 by Michael Ley (ley@uni-trier.de)