BibTeX record conf/bmei/WangLCT23

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@inproceedings{DBLP:conf/bmei/WangLCT23,
  author       = {Zikang Wang and
                  Jinzheng Lu and
                  Mingcan Chen and
                  Weidong Tan},
  editor       = {XiaoMing Zhao and
                  Qingli Li and
                  Lipo Wang},
  title        = {Mixed supervision model applied to industrial defect detection with
                  mask convolutional enhancement},
  booktitle    = {16th International Congress on Image and Signal Processing, BioMedical
                  Engineering and Informatics, {CISP-BMEI} 2023, Taizhou, China, October
                  28-30, 2023},
  pages        = {1--7},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/CISP-BMEI60920.2023.10373375},
  doi          = {10.1109/CISP-BMEI60920.2023.10373375},
  timestamp    = {Tue, 16 Jan 2024 20:11:16 +0100},
  biburl       = {https://dblp.org/rec/conf/bmei/WangLCT23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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