BibTeX record conf/bigdataconf/TienHCW20

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@inproceedings{DBLP:conf/bigdataconf/TienHCW20,
  author       = {Chin{-}Wei Tien and
                  Tse{-}Yung Huang and
                  Ping Chun Chen and
                  Jenq{-}Haur Wang},
  editor       = {Xintao Wu and
                  Chris Jermaine and
                  Li Xiong and
                  Xiaohua Hu and
                  Olivera Kotevska and
                  Siyuan Lu and
                  Weija Xu and
                  Srinivas Aluru and
                  Chengxiang Zhai and
                  Eyhab Al{-}Masri and
                  Zhiyuan Chen and
                  Jeff Saltz},
  title        = {Automatic Device Identification and Anomaly Detection with Machine
                  Learning Techniques in Smart Factories},
  booktitle    = {2020 {IEEE} International Conference on Big Data {(IEEE} BigData 2020),
                  Atlanta, GA, USA, December 10-13, 2020},
  pages        = {3539--3544},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/BigData50022.2020.9378168},
  doi          = {10.1109/BIGDATA50022.2020.9378168},
  timestamp    = {Fri, 19 Nov 2021 16:08:20 +0100},
  biburl       = {https://dblp.org/rec/conf/bigdataconf/TienHCW20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}