BibTeX record conf/bcicts/WeimerKMS23

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@inproceedings{DBLP:conf/bcicts/WeimerKMS23,
  author       = {Christoph Weimer and
                  Viktor Kazantsev and
                  Markus M{\"{a}}ller and
                  Michael Schr{\"{o}}ter},
  title        = {Numerical Device Simulation Aided Study of RF-Stress-Caused Degradation
                  in SiGe HBTs},
  booktitle    = {{IEEE} BiCMOS and Compound Semiconductor Integrated Circuits and Technology
                  Symposium, {BCICTS} 2023, Monterey, CA, USA, October 16-18, 2023},
  pages        = {249--252},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/BCICTS54660.2023.10310894},
  doi          = {10.1109/BCICTS54660.2023.10310894},
  timestamp    = {Mon, 05 Feb 2024 20:30:50 +0100},
  biburl       = {https://dblp.org/rec/conf/bcicts/WeimerKMS23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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