BibTeX record conf/bcicts/Niu22

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@inproceedings{DBLP:conf/bcicts/Niu22,
  author       = {Guofu Niu},
  title        = {Physics, Characterization and Modeling of {RF} Linearity in SiGe {HBT}
                  and FinFET Technologies},
  booktitle    = {2022 {IEEE} BiCMOS and Compound Semiconductor Integrated Circuits
                  and Technology Symposium, {BCICTS} 2022, Phoenix, AZ, USA, October
                  16-19, 2022},
  pages        = {70--77},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/BCICTS53451.2022.10051757},
  doi          = {10.1109/BCICTS53451.2022.10051757},
  timestamp    = {Mon, 06 Mar 2023 11:35:11 +0100},
  biburl       = {https://dblp.org/rec/conf/bcicts/Niu22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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