BibTeX record conf/bcicts/NguGKR19

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@inproceedings{DBLP:conf/bcicts/NguGKR19,
  author       = {Yves Ngu and
                  Ephrem G. Gebreselasie and
                  Rajendran Krishnasamy and
                  Rick Rassel},
  title        = {Ballast Resistor Temperature Effect and Ruggedness},
  booktitle    = {2019 {IEEE} BiCMOS and Compound semiconductor Integrated Circuits
                  and Technology Symposium (BCICTS), Nashville, TN, USA, November 3-6,
                  2019},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/BCICTS45179.2019.8972747},
  doi          = {10.1109/BCICTS45179.2019.8972747},
  timestamp    = {Fri, 16 Apr 2021 11:57:31 +0200},
  biburl       = {https://dblp.org/rec/conf/bcicts/NguGKR19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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