BibTeX record conf/bcicts/JonesPLCMBASK18

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@inproceedings{DBLP:conf/bcicts/JonesPLCMBASK18,
  author       = {Eric J. Jones and
                  Jonathan D. Poplawsky and
                  Donavan Leonard and
                  Keith Chung and
                  Kevin Mercurio and
                  Paul Brabant and
                  Thomas Adam and
                  Patrick B. Shea and
                  Thomas Knight},
  title        = {Quantification of Dopant Profiles in SiGe {HBT} Devices},
  booktitle    = {2018 {IEEE} BiCMOS and Compound Semiconductor Integrated Circuits
                  and Technology Symposium (BCICTS), San Diego, CA, USA, October 15-17,
                  2018},
  pages        = {255--258},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/BCICTS.2018.8551114},
  doi          = {10.1109/BCICTS.2018.8551114},
  timestamp    = {Sun, 08 Aug 2021 01:40:59 +0200},
  biburl       = {https://dblp.org/rec/conf/bcicts/JonesPLCMBASK18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}