BibTeX record conf/bcicts/JinWZS20

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@inproceedings{DBLP:conf/bcicts/JinWZS20,
  author       = {Xiaodi Jin and
                  Christoph Weimer and
                  Yaxin Zhang and
                  Michael Schr{\"{o}}ter},
  title        = {Modeling the temperature dependence of sheet and contact resistances
                  in SiGe: {C} HBTs from 4.3 to 423 {K}},
  booktitle    = {{IEEE} BiCMOS and Compound Semiconductor Integrated Circuits and Technology
                  Symposium, {BCICTS} 2020, Monterey, CA, USA, November 16-19, 2020},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/BCICTS48439.2020.9392930},
  doi          = {10.1109/BCICTS48439.2020.9392930},
  timestamp    = {Sun, 02 Oct 2022 15:55:21 +0200},
  biburl       = {https://dblp.org/rec/conf/bcicts/JinWZS20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}