BibTeX record conf/ats/ZhaoMTC10

download as .bib file

@inproceedings{DBLP:conf/ats/ZhaoMTC10,
  author       = {Wei Zhao and
                  Junxia Ma and
                  Mohammad Tehranipoor and
                  Sreejit Chakravarty},
  title        = {Power-Safe Application of Transition Delay Fault Patterns Considering
                  Current Limit during Wafer Test},
  booktitle    = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
                  December 2010, Shanghai, China},
  pages        = {301--306},
  publisher    = {{IEEE} Computer Society},
  year         = {2010},
  url          = {https://doi.org/10.1109/ATS.2010.58},
  doi          = {10.1109/ATS.2010.58},
  timestamp    = {Fri, 24 Mar 2023 00:02:34 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/ZhaoMTC10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.