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BibTeX record conf/ats/YuYCF07
@inproceedings{DBLP:conf/ats/YuYCF07, author = {Thomas Edison Yu and Tomokazu Yoneda and Krishnendu Chakrabarty and Hideo Fujiwara}, title = {Thermal-Safe Test Access Mechanism and Wrapper Co-optimization for System-on-Chip}, booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11, 2007}, pages = {187--192}, publisher = {{IEEE}}, year = {2007}, url = {https://doi.org/10.1109/ATS.2007.53}, doi = {10.1109/ATS.2007.53}, timestamp = {Wed, 09 Nov 2022 21:30:34 +0100}, biburl = {https://dblp.org/rec/conf/ats/YuYCF07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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