YotsuyanagiMH11'

@inproceedings{DBLP:conf/ats/YotsuyanagiMH11,
  author    = {Hiroyuki Yotsuyanagi and
               Hiroyuki Makimoto and
               Masaki Hashizume},
  title     = {A Boundary Scan Circuit with Time-to-Digital Converter for
               Delay Testing},
  booktitle = {Asian Test Symposium},
  year      = {2011},
  pages     = {539-544},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/ATS.2011.63},
  crossref  = {DBLP:conf/ats/2011},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/ats/2011,
  title     = {Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011,
               New Delhi, India, November 20-23, 2011},
  booktitle = {ATS},
  publisher = {IEEE Computer Society},
  year      = {2011},
  isbn      = {978-1-4577-1984-4},
  ee        = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6114262},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}