BibTeX record conf/ats/YoshikawOIF05

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@inproceedings{DBLP:conf/ats/YoshikawOIF05,
  author       = {Yuki Yoshikawa and
                  Satoshi Ohtake and
                  Michiko Inoue and
                  Hideo Fujiwara},
  title        = {Design for Testability Based on Single-Port-Change Delay Testing for
                  Data Paths},
  booktitle    = {14th Asian Test Symposium {(ATS} 2005), 18-21 December 2005, Calcutta,
                  India},
  pages        = {254--259},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/ATS.2005.47},
  doi          = {10.1109/ATS.2005.47},
  timestamp    = {Fri, 24 Mar 2023 00:02:34 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/YoshikawOIF05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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