Hiroshi Yokoyama Xiaoqing Wen Hideo Tamamoto Random Pattern Testable Design with Partial Circuit Duplication. 353-358 1997 conf/ats/1997 Asian Test Symposium http://doi.ieeecomputersociety.org/10.1109/ATS.1997.643982 db/conf/ats/ats1997.html#YokoyamaWT97