DBLP Record 'conf/ats/YanS04'

BibTeX

@inproceedings{DBLP:conf/ats/YanS04,
  author    = {Haihua Yan and
               Adit D. Singh},
  title     = {Reduce Yield Loss in Delay Defect Detection in Slack Interval},
  booktitle = {Asian Test Symposium},
  year      = {2004},
  pages     = {372-377},
  ee        = {http://csdl.computer.org/comp/proceedings/ats/2004/2235/00/22350372abs.htm},
  crossref  = {DBLP:conf/ats/2004},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/ats/2004,
  title     = {13th Asian Test Symposium (ATS 2004), 15-17 November 2004,
               Kenting, Taiwan},
  booktitle = {Asian Test Symposium},
  publisher = {IEEE Computer Society},
  year      = {2004},
  isbn      = {0-7695-2235-1},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}