Koji Yamazaki Teruhiko Yamada An approach to diagnose logical faults in partially observable sequential circuits. 168-173 1997 conf/ats/1997 Asian Test Symposium http://csdl.computer.org/comp/proceedings/ats/1997/8209/00/82090168abs.htm db/conf/ats/ats1997.html#YamazakiY97