Testability Prediction for Sequential Circuits Using Neural Network.

Shiyi Xu Peter Waignjo Percy G. Dias Bole Shi Testability Prediction for Sequential Circuits Using Neural Network. 48- 1997 conf/ats/1997 Asian Test Symposium http://csdl.computer.org/comp/proceedings/ats/1997/8209/00/82090048abs.htm db/conf/ats/ats1997.html#XuWDS97