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BibTeX record conf/ats/XuLCL03
@inproceedings{DBLP:conf/ats/XuLCL03, author = {Yongjun Xu and Zuying Luo and Zhiguo Chen and Xiaowei Li}, title = {Average Leakage Current Macromodeling for Dual-Threshold Voltage Circuits}, booktitle = {12th Asian Test Symposium {(ATS} 2003), 17-19 November 2003, Xian, China}, pages = {196--201}, publisher = {{IEEE} Computer Society}, year = {2003}, url = {https://doi.org/10.1109/ATS.2003.1250809}, doi = {10.1109/ATS.2003.1250809}, timestamp = {Fri, 24 Mar 2023 00:02:34 +0100}, biburl = {https://dblp.org/rec/conf/ats/XuLCL03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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