XiangCSF03'

BibTeX

@inproceedings{DBLP:conf/ats/XiangCSF03,
  author    = {Dong Xiang and
               Ming-Jing Chen and
               Jia-Guang Sun and
               Hideo Fujiwara},
  title     = {Improving Test Quality of Scan-Based BIST by Scan Chain
               Partitioning},
  booktitle = {Asian Test Symposium},
  year      = {2003},
  pages     = {12-17},
  ee        = {http://csdl.computer.org/comp/proceedings/ats/2003/1951/00/19510012abs.htm},
  crossref  = {DBLP:conf/ats/2003},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/ats/2003,
  title     = {12th Asian Test Symposium (ATS 2003), 17-19 November 2003,
               Xian, China},
  booktitle = {Asian Test Symposium},
  publisher = {IEEE Computer Society},
  year      = {2003},
  isbn      = {0-7695-1951-2},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}