BibTeX record conf/ats/WichlundA06

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@inproceedings{DBLP:conf/ats/WichlundA06,
  author       = {Sverre Wichlund and
                  Einar J. Aas},
  title        = {Reducing Scan Test Data Volume and Time: {A} Diagnosis Friendly Finite
                  Memory Compactor},
  booktitle    = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
                  2006},
  pages        = {421--430},
  publisher    = {{IEEE}},
  year         = {2006},
  url          = {https://doi.org/10.1109/ATS.2006.260965},
  doi          = {10.1109/ATS.2006.260965},
  timestamp    = {Mon, 07 Nov 2022 17:39:01 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/WichlundA06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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