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BibTeX record conf/ats/WenHTSK98
@inproceedings{DBLP:conf/ats/WenHTSK98, author = {Xiaoqing Wen and Tooru Honzawa and Hideo Tamamoto and Kewal K. Saluja and Kozo Kinoshita}, title = {Design for Diagnosability of {CMOS} Circuits}, booktitle = {7th Asian Test Symposium {(ATS} '98), 2-4 December 1998, Singapore}, pages = {144--149}, publisher = {{IEEE} Computer Society}, year = {1998}, url = {https://doi.org/10.1109/ATS.1998.741605}, doi = {10.1109/ATS.1998.741605}, timestamp = {Fri, 24 Mar 2023 00:02:34 +0100}, biburl = {https://dblp.org/rec/conf/ats/WenHTSK98.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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