BibTeX record conf/ats/WenHTSK98

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@inproceedings{DBLP:conf/ats/WenHTSK98,
  author       = {Xiaoqing Wen and
                  Tooru Honzawa and
                  Hideo Tamamoto and
                  Kewal K. Saluja and
                  Kozo Kinoshita},
  title        = {Design for Diagnosability of {CMOS} Circuits},
  booktitle    = {7th Asian Test Symposium {(ATS} '98), 2-4 December 1998, Singapore},
  pages        = {144--149},
  publisher    = {{IEEE} Computer Society},
  year         = {1998},
  url          = {https://doi.org/10.1109/ATS.1998.741605},
  doi          = {10.1109/ATS.1998.741605},
  timestamp    = {Fri, 24 Mar 2023 00:02:34 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/WenHTSK98.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}