<?xml version="1.0"?>
<dblp>
<inproceedings key="conf/ats/WangTWHWHLW01" mdate="2011-10-26">
<author>Chih-Wea Wang</author>
<author>Ruey-Shing Tzeng</author>
<author>Chi-Feng Wu</author>
<author>Chih-Tsun Huang</author>
<author>Cheng-Wen Wu</author>
<author>Shi-Yu Huang</author>
<author>Shyh-Horng Lin</author>
<author>Hsin-Po Wang</author>
<title>A Built-in Self-Test and Self-Diagnosis Scheme for Heterogeneous SRAM Clusters.</title>
<pages>103-</pages>
<year>2001</year>
<crossref>conf/ats/2001</crossref>
<booktitle>Asian Test Symposium</booktitle>
<ee>http://doi.ieeecomputersociety.org/10.1109/ATS.2001.990267</ee>
<url>db/conf/ats/ats2001.html#WangTWHWHLW01</url>
</inproceedings>
</dblp>
