BibTeX record conf/ats/WangGB06

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@inproceedings{DBLP:conf/ats/WangGB06,
  author       = {Lei Wang and
                  Sandeep K. Gupta and
                  Melvin A. Breuer},
  title        = {Diagnosis of delay faults due to resistive bridges, delay variations
                  and defects},
  booktitle    = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
                  2006},
  pages        = {215--224},
  publisher    = {{IEEE}},
  year         = {2006},
  url          = {https://doi.org/10.1109/ATS.2006.261023},
  doi          = {10.1109/ATS.2006.261023},
  timestamp    = {Thu, 21 Sep 2023 10:09:54 +0200},
  biburl       = {https://dblp.org/rec/conf/ats/WangGB06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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