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BibTeX record conf/ats/WangGB06
@inproceedings{DBLP:conf/ats/WangGB06, author = {Lei Wang and Sandeep K. Gupta and Melvin A. Breuer}, title = {Diagnosis of delay faults due to resistive bridges, delay variations and defects}, booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23, 2006}, pages = {215--224}, publisher = {{IEEE}}, year = {2006}, url = {https://doi.org/10.1109/ATS.2006.261023}, doi = {10.1109/ATS.2006.261023}, timestamp = {Thu, 21 Sep 2023 10:09:54 +0200}, biburl = {https://dblp.org/rec/conf/ats/WangGB06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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