TakahashiYT95'

@inproceedings{DBLP:conf/ats/TakahashiYT95,
  author    = {Hiroshi Takahashi and
               Nobuhiro Yanagida and
               Yuzo Takamatsu},
  title     = {Enhancing multiple fault diagnosis in combinational circuits
               based on sensitized paths and EB testing},
  booktitle = {Asian Test Symposium},
  year      = {1995},
  pages     = {58-64},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/ATS.1995.485317},
  crossref  = {DBLP:conf/ats/1995},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/ats/1995,
  title     = {4th Asian Test Symposium (ATS '95), November 23-24, 1995.
               Bangalore, India},
  booktitle = {Asian Test Symposium},
  publisher = {IEEE Computer Society},
  year      = {1995},
  isbn      = {0-8186-7129-7},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}