BibTeX record conf/ats/TakahashiHKATYT07

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@inproceedings{DBLP:conf/ats/TakahashiHKATYT07,
  author       = {Hiroshi Takahashi and
                  Yoshinobu Higami and
                  Shuhei Kadoyama and
                  Takashi Aikyo and
                  Yuzo Takamatsu and
                  Koji Yamazaki and
                  Toshiyuki Tsutsumi and
                  Hiroyuki Yotsuyanagi and
                  Masaki Hashizume},
  title        = {Clues for Modeling and Diagnosing Open Faults with Considering Adjacent
                  Lines},
  booktitle    = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
                  2007},
  pages        = {39--44},
  publisher    = {{IEEE}},
  year         = {2007},
  url          = {https://doi.org/10.1109/ATS.2007.34},
  doi          = {10.1109/ATS.2007.34},
  timestamp    = {Wed, 09 Nov 2022 21:30:35 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/TakahashiHKATYT07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}