BibTeX record conf/ats/SootkaneungCH21

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@inproceedings{DBLP:conf/ats/SootkaneungCH21,
  author       = {Warin Sootkaneung and
                  Sasithorn Chookaew and
                  Suppachai Howimanporn},
  title        = {Temperature-Aware Evaluation and Mitigation of Logic Soft Errors Under
                  Circuit Variations},
  booktitle    = {30th {IEEE} Asian Test Symposium, {ATS} 2021, Matsuyama, Ehime, Japan,
                  November 22-25, 2021},
  pages        = {31--36},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/ATS52891.2021.00018},
  doi          = {10.1109/ATS52891.2021.00018},
  timestamp    = {Thu, 23 Jun 2022 19:58:43 +0200},
  biburl       = {https://dblp.org/rec/conf/ats/SootkaneungCH21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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