BibTeX record conf/ats/SootkaneungCH16

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@inproceedings{DBLP:conf/ats/SootkaneungCH16,
  author       = {Warin Sootkaneung and
                  Sasithorn Chookaew and
                  Suppachai Howimanporn},
  title        = {Combined Impact of {BTI} and Temperature Effect Inversion on Circuit
                  Performance},
  booktitle    = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
                  21-24, 2016},
  pages        = {310--315},
  publisher    = {{IEEE} Computer Society},
  year         = {2016},
  url          = {https://doi.org/10.1109/ATS.2016.34},
  doi          = {10.1109/ATS.2016.34},
  timestamp    = {Fri, 24 Mar 2023 00:02:34 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/SootkaneungCH16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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