BibTeX
@inproceedings{DBLP:conf/ats/Singh05,
author = {Adit D. Singh},
title = {T2: Statistical Methods for VLSI Test and Burn-in Optimization},
booktitle = {Asian Test Symposium},
year = {2005},
ee = {http://doi.ieeecomputersociety.org/10.1109/ATS.2005.104},
crossref = {DBLP:conf/ats/2005},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/ats/2005,
title = {14th Asian Test Symposium (ATS 2005), 18-21 December 2005,
Calcutta, India},
booktitle = {Asian Test Symposium},
publisher = {IEEE Computer Society},
year = {2005},
isbn = {0-7695-2481-8},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2006-07-12 by Michael Ley (ley@uni-trier.de)