BibTeX record conf/ats/ShintaniII21

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@inproceedings{DBLP:conf/ats/ShintaniII21,
  author       = {Michihiro Shintani and
                  Mamoru Ishizaka and
                  Michiko Inoue},
  title        = {Robust Fault-Tolerant Design Based on Checksum and On-Line Testing
                  for Memristor Neural Network},
  booktitle    = {30th {IEEE} Asian Test Symposium, {ATS} 2021, Matsuyama, Ehime, Japan,
                  November 22-25, 2021},
  pages        = {25--30},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/ATS52891.2021.00017},
  doi          = {10.1109/ATS52891.2021.00017},
  timestamp    = {Tue, 21 Mar 2023 20:58:23 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/ShintaniII21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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