Tsuyoshi Shinogi Yuki Yamada Terumine Hayashi Tomohiro Yoshikawa Shinji Tsuruoka Between-Core Vector Overlapping for Test Cost Reduction in Core Testing. 268-273 2003 conf/ats/2003 Asian Test Symposium http://csdl.computer.org/comp/proceedings/ats/2003/1951/00/19510268abs.htm db/conf/ats/ats2003.html#ShinogiYHYT03