A Test Cost Reduction Method by Test Response and Test Vector Overlapping for Full-Scan Test Architecture.

Tsuyoshi Shinogi Hiroyuki Yamada Terumine Hayashi Shinji Tsuruoka Tomohiro Yoshikawa A Test Cost Reduction Method by Test Response and Test Vector Overlapping for Full-Scan Test Architecture. 366-371 2005 conf/ats/2005 Asian Test Symposium http://doi.ieeecomputersociety.org/10.1109/ATS.2005.17 db/conf/ats/ats2005.html#ShinogiYHTY05