<?xml version="1.0"?>
<dblp>
<inproceedings key="conf/ats/ShinogiKYTH01" mdate="2003-08-22">
<author>Tsuyoshi Shinogi</author>
<author>Tomokazu Kanbayashi</author>
<author>Tomohiro Yoshikawa</author>
<author>Shinji Tsuruoka</author>
<author>Terumine Hayashi</author>
<title>Faulty Resistance Sectioning Technique for Resistive Bridging Fault ATPG Systems.</title>
<pages>76-81</pages>
<year>2001</year>
<crossref>conf/ats/2001</crossref>
<booktitle>Asian Test Symposium</booktitle>
<ee>http://csdl.computer.org/comp/proceedings/ats/2001/1378/00/13780076abs.htm</ee>
<url>db/conf/ats/ats2001.html#ShinogiKYTH01</url>
</inproceedings>
</dblp>
