BibTeX
@inproceedings{DBLP:conf/ats/ShinogiKYTH01,
author = {Tsuyoshi Shinogi and
Tomokazu Kanbayashi and
Tomohiro Yoshikawa and
Shinji Tsuruoka and
Terumine Hayashi},
title = {Faulty Resistance Sectioning Technique for Resistive Bridging
Fault ATPG Systems},
booktitle = {Asian Test Symposium},
year = {2001},
pages = {76-81},
ee = {http://csdl.computer.org/comp/proceedings/ats/2001/1378/00/13780076abs.htm},
crossref = {DBLP:conf/ats/2001},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/ats/2001,
title = {10th Asian Test Symposium (ATS 2001), 19-21 November 2001,
Kyoto, Japan},
booktitle = {Asian Test Symposium},
publisher = {IEEE Computer Society},
year = {2001},
isbn = {0-7695-1378-6},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2003-08-22 by Michael Ley (ley@uni-trier.de)