Low Power Test Compression Technique for Designs with Multiple Scan Chain.

Youhua Shi Nozomu Togawa Masao Yanagisawa Tatsuo Ohtsuki Shinji Kimura Low Power Test Compression Technique for Designs with Multiple Scan Chain. 386-389 2005 conf/ats/2005 Asian Test Symposium http://doi.ieeecomputersociety.org/10.1109/ATS.2005.76 db/conf/ats/ats2005.html#ShiTYOK05