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DBLP Record 'conf/ats/SavirG02'

BibTeX

@inproceedings{DBLP:conf/ats/SavirG02,
  author    = {Jacob Savir and
               Zhen Guo},
  title     = {Test Limitations of Parametric Faults in Analog Circuits},
  booktitle = {Asian Test Symposium},
  year      = {2002},
  pages     = {39-44},
  ee        = {http://csdl.computer.org/comp/proceedings/ats/2002/1825/00/18250039abs.htm},
  crossref  = {DBLP:conf/ats/2002},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/ats/2002,
  title     = {11th Asian Test Symposium (ATS 2002), 18-20 November 2002,
               Guam, USA},
  booktitle = {Asian Test Symposium},
  publisher = {IEEE Computer Society},
  year      = {2002},
  isbn      = {0-7695-1825-7},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

Copyright © 2003-08-22 by Michael Ley (ley@uni-trier.de)