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BibTeX record conf/ats/SatoNKIO0OIZKKH22
@inproceedings{DBLP:conf/ats/SatoNKIO0OIZKKH22, author = {Keno Sato and Takayuki Nakatani and Shogo Katayama and Daisuke Iimori and Gaku Ogihara and Takashi Ishida and Toshiyuki Okamoto and Tamotsu Ichikawa and Yujie Zhao and Kentaroh Katoh and Anna Kuwana and Kazumi Hatayama and Haruo Kobayashi}, title = {High Precision Voltage Measurement System Utilizing Low-End {ATE} Resource and {BOST}}, booktitle = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan, November 21-24, 2022}, pages = {37--42}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/ATS56056.2022.00019}, doi = {10.1109/ATS56056.2022.00019}, timestamp = {Wed, 11 Jan 2023 15:00:17 +0100}, biburl = {https://dblp.org/rec/conf/ats/SatoNKIO0OIZKKH22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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