BibTeX record conf/ats/SatoNIOIKOIZWKH21

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@inproceedings{DBLP:conf/ats/SatoNIOIKOIZWKH21,
  author       = {Keno Sato and
                  Takayuki Nakatani and
                  Takashi Ishida and
                  Toshiyuki Okamoto and
                  Tamotsu Ichikawa and
                  Shogo Katayama and
                  Gaku Ogihara and
                  Daisuke Iimori and
                  Yujie Zhao and
                  Jianglin Wei and
                  Anna Kuwana and
                  Kazumi Hatayama and
                  Haruo Kobayashi},
  title        = {High Precision Measurement of Sub-Nano Ampere Current in {ATE} Environment},
  booktitle    = {30th {IEEE} Asian Test Symposium, {ATS} 2021, Matsuyama, Ehime, Japan,
                  November 22-25, 2021},
  pages        = {139--140},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/ATS52891.2021.00036},
  doi          = {10.1109/ATS52891.2021.00036},
  timestamp    = {Mon, 21 Mar 2022 15:41:16 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/SatoNIOIKOIZWKH21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}