BibTeX record conf/ats/SanyalPDB19

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@inproceedings{DBLP:conf/ats/SanyalPDB19,
  author       = {Sayandeep Sanyal and
                  Amit Patra and
                  Pallab Dasgupta and
                  Mayukh Bhattacharya},
  title        = {A Structured Approach for Rapid Identification of Fault-Sensitive
                  Nets in Analog Circuits},
  booktitle    = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
                  10-13, 2019},
  pages        = {135--140},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/ATS47505.2019.00025},
  doi          = {10.1109/ATS47505.2019.00025},
  timestamp    = {Tue, 14 Jan 2020 13:24:45 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/SanyalPDB19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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